Ann Thryft has written for EDN, RTC Magazine, COTS Journal, NIkkei Electronics Asia, EE Times, Computer Design, and Electronic Buyers' News. She introduced readers to several emerging trends: early mobile phone architectures, set-top box system design, open network server and switch/router architectures, software-defined radio, and RFID. At EBN Ann won two independently judged Editorial Excellence awards for Best Technology Feature. Currently, she is a Contributing Technical Editor for Test & Measurement World, and assists in researching and writing reports for In-Stat. She holds a BA in Cultural Anthropology from Stanford University and a Certified Business Communicator certificate from the Business Marketing Association (formerly B/PAA).
