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Werth, manufacturer of measurement and testing equipment, now offers its new TomoScope HV Compact coordinate measuring machine, filling a gap between its large TomoScope HV 500 and the small TomoScope 200.
MPW Staff
February 3, 2009
1 Min Read
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Werth's TomoScope HV Compact coordinate measuring machine
Werth, manufacturer of measurement and testing equipment, now offers its new TomoScope HV Compact coordinate measuring machine, filling a gap between its large TomoScope HV 500 and the small TomoScope 200. The TomoScope HV Compact is suitable for measuring high-density components made of glass-fiber reinforced plastics, aluminum, steel, titanium, composite materials and ceramics. The TomoScope machines have a specification for contact and length measurement deviations, as is typical for CMMs. Atypical is that this supplier claims to be the only one able to guarantee the traceability of measurement results to the length standard of Germany’s National Measurement Institute as applied on the actual workpiece. Raster tomography ensures small features can be measured at high resolution, even on large parts. Measurement of workpieces constructed or assembled from multiple materials is facilitated. Werth is headquartered in Giessen, Germany and in North America at Werth Inc., Old Saybrook, CT.Werth also has recently introduced to the market its Werth FlatScope for fast, precise, and reliable inspection of flat work pieces and extrusion profiles. Profiles up to 650 mm (diameter) can be measured on standard models; larger measuring ranges can be supplied upon request.
The unit is equipped with an Image Processing Sensor with telecentric or zoom optics as required. Completely automatic measurement of complicated, low-contrast work pieces in Backlight and Surface Illumination can be done. In Grid Scanning mode, the entire measuring area can be scanned quickly and all geometrical characteristics recorded and evaluated. Software supplied by the company is said to be simple enough to allow for even untrained operators to accurately conduct measurements.—[email protected]
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