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November 1, 2001

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In-Line, Non-Nuclear Thickness Measurement System Works On Non-Conductive Materials

November, 2001

Instruments:

In-Line, Non-Nuclear Thickness Measurement System Works On Non-Conductive Materials

1101pn-27.jpgThe traversing Laser Thickness Profiler (LTP-100) is an in-line gaging system designed fornon-conductive materials. Manufacturer LASOR/Systronics says it can measure material thickness with an accuracy of ±0.006 in. with a resolution of 0.0002 in.

The system makes readings every 0.1 in. while traversing across the web. An included operator interface displays, stores and prints thickness data, and provides a crossweb thickness profile with alarm limits, a summary end-of-roll report, downweb location and thickness measurement data.

Measurement information is displayed on a high-resolution color monitor in Windows NT. The downweb graph shows the downweb thickness trends from data taken from the crossweb graphs. Data displayed on the downweb graph include average thickness, minimum thickness, maximum thickness and the thickness from each side-center-side averaging window.

During graph configuration, users can determine which data sets to display on the graph. Optionally, users can display the downweb data in terms of footage or thickness scans. The system interfaces with networks or PLCs.

Prices for the LTP-100 range from $60,000 to $100,000, depending on the length of the frame and the sophistication of the laser used.

LASOR/Systronics
Norcross, GA Circle 109

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