An instrument for offline structure analysis of transparent and semi-transparent multilayer films determines simultaneously the thickness accuracy of all film layers during processing. The LayerGauge uses ordinary white light to measure the weak reflections from the boundaries between the different layers. This technology, interferometry, detects the reflections and by a special optical and electronic arrangement converts these into electronic sensor signals.
These signals are shown as peaks and valleys on the measuring detector. Each peak represents the location of a corresponding layer interface. The separation of the adjacent peaks indicates the optical thickness of the layer. Davinor, Helsinki, Finland; +358 9 7588640; www.davinor.com
